view article
Figure 2
(a) Photograph of the X-ray diffraction microscope mounted on an undulator beamline (BL29XUL) at SPring-8, including a pinhole, a sample chamber, a photodiode, an attenuator, a beamstop and a CCD camera. (b) Photograph of the sample chamber, including two guard corners, a sample mount and a rotary stage.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 2| March 2011| Pages 293-298
https://doi.org/10.1107/S0909049510051733
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS