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Figure 3
(a) The image formed on a white board from the analyzer by slightly tightening the screws on the bender, (b) a change in focus as screws are tightened further, (c) an optimized focus, (d) the intensity profile of the focused beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 3| March 2011| Pages 492-496
doi:10.1107/S0909049511001828
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