High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction

Raghavan, S.; Imbrie, P.

doi:10.1107/S0909049511009071

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 8
$[\sigma_{11}]$ stress map of a half-specimen as viewed from the $[\varphi]$ = 90° face (obtained from $[\varphi]$ = 0° data and averaged horizontally across each row to represent the $[\varphi]$ = 90° direction) at increasing applied compressive stress in the S₃ direction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 3| April 2011| Pages 497-505

doi:10.1107/S0909049511009071

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