view article
Figure 5
Spatially resolved DE measurement. (a) The FZP is illuminated through a pinhole and the focused intensity is filtered by an OSA in the focus of the FZP. (b) The FZP and OSA are removed and the incoming intensity is measured. (c) Spatially resolved diffraction efficiency of a 500 nm-thick 100 µm-diameter FZP with an outermost zone of 50 nm at 6.2 keV photon energy.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 3| March 2011| Pages 442-446
doi:10.1107/S0909049511002366
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS