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Figure 7
One-dimensional diffraction diagram of a single integrated segment (Fig. 4[link]) after Rietveld-texture refinement. Crosses mark the measured data points; the continuous line represents the fitting. In the lower part the difference curve is shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 4| July 2011| Pages 550-556
https://doi.org/10.1107/S0909049511011071
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