Radiation-induced melting in coherent X-ray diffractive imaging at the nanoscale

Ponomarenko, O.; Nikulin, A.Y.; Moser, H.O.; Yang, P.; Sakata, O.

doi:10.1107/S0909049511016335

Journal of Synchrotron Radiation Journal of
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Figure 1
Fraunhofer diffraction profiles recorded from a test nanostructure in PMMA resist at the BL13XU beamline, SPring-8, Japan: the upper and lower curves were recorded under the same experimental conditions with an interval of approximately 20 min. The curves are shifted by an order of magnitude for better visibility.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 4| July 2011| Pages 580-594

https://doi.org/10.1107/S0909049511016335

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