view article
Figure 5
Diffraction patterns of Si reference powder measured using the PSD [λ = 0.826425 (5) Å] with acquisition times (a) 1 s, (b) 0.1 s and (c) 0.05 s. Each dataset is presented with the results of the final Rietveld refinement. Note that the few reflections missing were co-incident with the gaps between successive sensor modules. (d) High-angle reflections with peak widths of Δ2θ ≃ 0.04° showing the resolving power of the PSD.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 4| July 2011| Pages 637-648
https://doi.org/10.1107/S0909049511013641
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS