Fast X-ray powder diffraction on I11 at Diamond

Thompson, S.P.; Parker, J.E.; Marchal, J.; Potter, J.; Birt, A.; Yuan, F.; Fearn, R.D.; Lennie, A.R.; Street, S.R.; Tang, C.C.

doi:10.1107/S0909049511013641

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Figure 7
PSD powder diffraction pattern of MgH₂ at room temperature [λ = 1.062427 (5) Å]. Cell parameters and relative weight percents of each phase (MgH₂, MgO, Mg) as determined by Rietveld refinement are given in Table 3

. The inset shows an enlargement of the data in the region of the MgH₂ (111) and (210) reflections whose intensity arises mainly from the H-atom sub-lattice demonstrating the instrumental sensitivity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 18| Part 4| July 2011| Pages 637-648

https://doi.org/10.1107/S0909049511013641

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