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Figure 8
Pole figures depicting the angular change in lattice plane normal direction for four spurious deformation modes at an effective strain of 100 µ∊. The sampling region is enclosed by a white outline. The movements of the sampled lattice plane normals are relatively insensitive to these deformation modes. As a result, these deformation modes can spuriously arise in the deformation gradient calculation owing to measurement noise.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 2| January 2012| Pages 237-244
doi:10.1107/S0909049511050400
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