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Figure 5
(a) Time-dependent specular X-ray intensity during deposition of 59 nm VC1–x; (b) reflectivity measurement performed before and after deposition (black line). The simulated reflectivity curves [gray line (red online)] are slightly offset; the inset shows the δ-profile used for the fit.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 2| January 2012| Pages 216-222
doi:10.1107/S0909049511052320
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