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Figure 3
Illustration of the microstructure at the sample surface and in the bulk. (a) Coarse (100 µm step size) HETL orientation map of the sample central region before deformation. (b) Fine (50 µm step size) HETL orientation map of the sample gauge region before deformation. (c) Optical micrograph of the sample before deformation. (d) EBSD orientation map (20 µm step size) of the sample gauge region. The scale bar applies to (b), (c) and (d), and the same colour coding is used for all orientation maps.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 3| March 2012| Pages 307-318
doi:10.1107/S0909049512003044
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