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Figure 6
TDRC spectrum for a MOS capacitor fabricated on 〈111〉 silicon irradiated to 4.8 MGy after annealing for 32 h at 353 K. The signal owing to the Dit2 state is significantly reduced owing to annealing.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 3| March 2012| Pages 340-346
doi:10.1107/S0909049512002348
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