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Figure 11
Top: scanning-electron-microscope image taken of 3 µm-thick Au letters of height 50 µm on 300 µm Si at 4.83 keV. Bottom: X-ray image reconstructed using the η algorithm. The angle and modulation in the reconstructed image are due to slight misalignment between the sample and strips and the shape of the collimating slit, respectively.

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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