Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

Schubert, A.; Bergamaschi, A.; David, C.; Dinapoli, R.; Elbracht-Leong, S.; Gorelick, S.; Graafsma, H.; Henrich, B.; Johnson, I.; Lohmann, M.; Mozzanica, A.; Radicci, V.; Rassool, R.; Schädler, L.; Schmitt, B.; Shi, X.; Sobott, B.

doi:10.1107/S090904951200235X

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Figure 11
Top: scanning-electron-microscope image taken of 3 µm-thick Au letters of height 50 µm on 300 µm Si at 4.83 keV. Bottom: X-ray image reconstructed using the η algorithm. The angle and modulation in the reconstructed image are due to slight misalignment between the sample and strips and the shape of the collimating slit, respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 3| March 2012| Pages 359-365

doi:10.1107/S090904951200235X

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