Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

Schubert, A.; Bergamaschi, A.; David, C.; Dinapoli, R.; Elbracht-Leong, S.; Gorelick, S.; Graafsma, H.; Henrich, B.; Johnson, I.; Lohmann, M.; Mozzanica, A.; Radicci, V.; Rassool, R.; Schädler, L.; Schmitt, B.; Shi, X.; Sobott, B.

doi:10.1107/S090904951200235X

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 4
Simulated η distribution for ENC = 340 and 390 e⁻ which correspond to the minimum and maximum noise values measured for the 20 µm-pitch strips. The Gaussian fits show a broadening of the lateral peaks with increased noise.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 3| March 2012| Pages 359-365

doi:10.1107/S090904951200235X

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