view article
Figure 3
(a) FTIR absorption spectra, in the 950−840 cm−1 range, of phenylsilane-doped films exposed to a 1054 J cm−2 dose and containing decreasing amounts of C60 in the sol used for films deposition: 4 mg (dashed line), 2.5 (dotted line) and 0 mg (dash-dotted line). The unexposed sample without fullerene (solid line) is also shown as a reference. (b) FTIR absorption spectra, in the 950−840 cm−1 range, of phenylsilane-doped films exposed to 2108 J cm−2 dose and containing decreasing amounts of C60 in the sol used for films deposition: 4 mg (dashed line), 2.5 (dotted line) and 0 mg (dash-dotted line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| June 2012| Pages 586-590
doi:10.1107/S0909049512012848
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS