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Figure 6
(a) FTIR absorption spectra, in the 1440–1420 cm−1 range, of phenylsilane-doped films exposed to a 1054 J cm−2 dose and containing decreasing amounts of C60 in the sol used for films deposition: 4 mg (solid line), 2.5 (dashed line) and 0 mg (dotted line). (b) FTIR absorption spectra, in the 1440–1420 cm−1 range, of phenylsilane-doped films exposed to a 2108 J cm−2 dose and containing decreasing amounts of C60 in the sol used for films deposition: 4 mg (solid line), 2.5 (dashed line) and 0 mg (dotted line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| June 2012| Pages 586-590
doi:10.1107/S0909049512012848
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