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Figure 3
Reflectivity measured using an in-vacuum APD from a Si-supported polymer film of thickness ∼800 nm. X-ray standing-wave oscillations are clearly resolved to a high resolution between the critical angles of the film and substrate (the shaded region).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| June 2012| Pages 627-636
doi:10.1107/S0909049512022017
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