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Figure 5
(a) Scanning electron microscope (SEM) image from a centered rectangular array of BiFeO3 nanodots. Each nanodot is 200 nm in diameter and the array line spacing is 1 µm. (b) GISAXS pattern, with the boxed region magnified in (c). The diffractions from the in-plane spacing along the qx direction are labeled for the first through seventh orders. As indicated in equations (1)[link] and (2)[link], and in Fig. 2[link], the vertical axis of the incident scattering plane (with in-plane scattering angle 2θ = 0) on the 2D area detector contains both qx and qz components that are related through qx = qztan(1/2)(αi − αf). In typical GISAXS data, the qx component is so small that this component is usually not of much interest for most samples. The qx range covered in this experiment, however, is extremely revealing for the sample with very large ordered in-plane spacing between the features on a micrometer length scale. Therefore, qx, instead of the ordinary qz, is used to label the vertical axis.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| June 2012| Pages 627-636
doi:10.1107/S0909049512022017
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