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Figure 2
SEM image of the surface of a Si photovoltaic cell (a). XRF intensity map of Si (b), and Zn and Fe (c), acquired over the region delimited by the black box in the higher-resolution SEM image. XBIC map acquired simultaneously with the XRF (d). All measurements were carried out at room temperature.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| May 2012| Pages 521-524
doi:10.1107/S0909049512021383
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