view article
Figure 3
Average XRF spectrum acquired over a 140 µm × 100 µm area of a GaAs sample (a). XEOL intensity map of the peak centred around 1.50 eV and associated with a bound-exciton transition (b). XRF intensity maps over the scanned area of Ga (c), As (d), Fe (e) and Ni (f) Kα lines. XEOL and XRF maps were acquired simultaneously and at liquid-nitrogen temperature.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 4| May 2012| Pages 521-524
doi:10.1107/S0909049512021383
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS