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Figure 3
(a) Scanning X-ray diffraction map of a SiGe island array and (b) a scanning absorption image of the AFM tip at the SiGe(004) Bragg angle. The cross in (b) marks the position of the focal spot of the X-ray beam.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 5| July 2012| Pages 688-694
doi:10.1107/S0909049512023758
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