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Figure 3
Top: magnification of the out-of-plane region of the GIXD diffraction pattern of a RUB thin film grown on a TEN substrate. Bottom: one-dimensional diffractogram obtained by radial integration of the two-dimensional pattern reported at the top. The numbers indicating the peaks refer to Table 1[link]. Peak 1 originates from RUB, while the other three peaks originate from the substrate.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 5| July 2012| Pages 682-687
doi:10.1107/S0909049512027562
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