Figure 1
Circuit diagram of the Sawyer–Tower measurement system implemented on the XMaS beamline. The device under test (DUT) is placed in series with a sense capacitor. The voltage across the capacitor is monitored with an electrometer, and compared with the voltage applied to the DUT via the monitor voltage output from the amplifier. Back-to-back diodes are placed across the electrometer input for protection in the event of a sample breakdown. The circuit is shorted via a relay at the start of each experiment. |