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Figure 6
Optical micrographs (reflection, 100×) of developed (a) as-spun and (b) annealed (423 K, 1 h) samples, patterned with identical doses (20, 40, 59, 99, 198, 296, 395, 593, 790 MGy) and dose rates (620 MGy s−1) of 300 eV X-rays [(a) and (b) are on the same spatial scale]. Atomic force micrographs of developed (c) as-spun, (d) annealed and (e) vacuum-dried (343 K, 2 × 10−2 torr, 24 h) samples which received the same dose [(c), (d) and (e) are on equal height and spatial scales].

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 6| November 2012| Pages 976-987
https://doi.org/10.1107/S0909049512034486
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