A hard X-ray nanoprobe beamline for nanoscale microscopy

Winarski, R.P.; Holt, M.V.; Rose, V.; Fuesz, P.; Carbaugh, D.; Benson, C.; Shu, D.; Kline, D.; Stephenson, G.B.; McNulty, I.; Maser, J.

doi:10.1107/S0909049512036783

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 7
Full-field image of spoked test pattern. Inner spokes are 24 nm in width. Phasing effects in the image are due to protective film encapsulation of the test pattern and partial coherence of the illumination. The scale bar is 2.5 µm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 6| November 2012| Pages 1056-1060

https://doi.org/10.1107/S0909049512036783

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