A 30 nm-resolution hard X-ray microscope with X-ray fluorescence mapping capability at BSRF

Yuan, Q.; Zhang, K.; Hong, Y.; Huang, W.; Gao, K.; Wang, Z.; Zhu, P.; Gelb, J.; Tkachuk, A.; Hornberger, B.; Feser, M.; Yun, W.; Wu, Z.

doi:10.1107/S0909049512032852

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
(a) Two-dimensional image and (b) rendering of a three-dimensional tomographic volume of a Siemens star resolution test target with 50 nm finest features imaged using the laboratory source operating at 8 keV.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 19| Part 6| November 2012| Pages 1021-1028

https://doi.org/10.1107/S0909049512032852

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