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Figure 3
A semi-quantitative representation of the distribution of the specularly reflected beam intensity as a function of the glancing angle of the X-ray beam to the sample surface. I0: intensity distribution of the convergent X-ray beam incident onto the sample. Blue and red lines are for cases α0 = 0.96° and α0 = 1.20°, where α0 is the glancing angle which the horizontal X-ray beam from the source to the polychromator crystal makes with the sample surface after being reflected downward by the polychromator crystal. R: the specular reflectivity of a sample (silicon single crystal). I0 × R: the product of I0 and R which approximately represents the intensity distribution I of the X-ray beam specularly reflected by the sample.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 1| January 2013| Pages 80-88
https://doi.org/10.1107/S0909049512043415
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