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Figure 5
Diffraction pattern from a reference powder sample of silicon (NIST) using the all-in-vacuum diffractometer at an X-ray wavelength λ = 1.054 Å from beamline I911-1 at MAX-lab.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 1| January 2013| Pages 98-104
https://doi.org/10.1107/S0909049512039441
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