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![[Figure 4]](xh5030fig4mag.jpg)
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Figure 4
Schematic illustration of the time evolution of damage as manifested in X-ray diffraction at T = 100 K and 300 K. Some processes occur very quickly, but have only small effects on atomic positions and diffraction. Other processes take place over a range of timescales, but eventually have large effects on diffraction. The shaded area represents the range of timescales relevant to data collection with a detector framing at 10 Hz: one frame takes 100 ms, while a 100-frame data set takes 10 s. At 100 K the slower diffusive damage processes no longer contribute, and the much smaller long-time damage is determined by the remaining fast processes. |
![[Figure 4]](xh5030fig4.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
