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Figure 2
(Color online) Normalized absorbance spectra (a) and isolated fine structure (b) measured at the Co K-edge for Co nanoparticles formed in SiO2 on Si comparing samples before and after the removal of the Si substrate. In (a) the inset compares multi-channel analyzer spectra recorded at 8 keV.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 3| April 2013| Pages 426-432
doi:10.1107/S0909049513005049
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