Interface characterization of B4C-based multilayers by X-ray grazing-incidence reflectivity and diffuse scattering

Jiang, H.; Wang, Z.; Zhu, J.

doi:10.1107/S0909049513004329

Journal of Synchrotron Radiation Journal of
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Figure 1
X-ray grazing-incidence reflectivity and fitted curve for the W/B₄C [sample 1, (a)], Mo/B₄C [sample 5, (b)] and La/B₄C [sample 7, (c)] multilayers. In the upper right-hand corner of each figure the normalized ACF curve is presented to show the layer thickness directly.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 20| Part 3| March 2013| Pages 449-454

doi:10.1107/S0909049513004329

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