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Figure 1
First page of the iCorrector wizard: modelling of the electric field intensity distribution within the film under study. An excitation radiation interference scheme for a thin transparent film placed on top of the reflecting wafer is depicted. The user specifies initial parameters (left) and material optical constants (right), and obtains a field intensity map (bottom).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 3| March 2013| Pages 509-514
doi:10.1107/S0909049513002835
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