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Figure 1
First page of the iCorrector wizard: modelling of the electric field intensity distribution within the film under study. An excitation radiation interference scheme for a thin transparent film placed on top of the reflecting wafer is depicted. The user specifies initial parameters (left) and material optical constants (right), and obtains a field intensity map (bottom).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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