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Figure 1
Textured polycrystalline thin films on three different substrates. (a) Polycrystalline ZnO on Si (100), showing strong contribution of thermal diffuse scattering located close to the Bragg reflections of the silicon substrate. (b) Semi-oriented CaCO3 on soda-lime glass, showing diffuse scattering at low angles making data analysis difficult. (c) A clean SrTiO3 single-crystal substrate, showing an extremely well defined reflection of SrTiO3 (110), and no diffuse scattering.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 4| May 2013| Pages 644-647
doi:10.1107/S0909049513009102
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