On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films

Sønsteby, H.H.; Chernyshov, D.; Getz, M.; Nilsen, O.; Fjellvåg, H.

doi:10.1107/S0909049513009102

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 3
(a) SrTiO₃ (100) and LaAlO₃ (100) in a LaAlO₃||SrTiO₃ system where the SrTiO₃ substrate is TiO₂-terminated after hydrofluoric acid etching. (b) SrTiO₃ (100) and LaAlO₃ (100) in a LaAlO₃||SrTiO₃ system without pre-treatment of the substrate. Both samples are represented by the same intensity scheme for comparison.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 20| Part 4| May 2013| Pages 644-647

doi:10.1107/S0909049513009102

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page