On the application of a single-crystal κ-diffractometer and a CCD area detector for studies of thin films

Sønsteby, H.H.; Chernyshov, D.; Getz, M.; Nilsen, O.; Fjellvåg, H.

doi:10.1107/S0909049513009102

Journal of Synchrotron Radiation Journal of
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Figure 4
(a) LaAlO₃ (100) in the LaAlO₃||LaAlO₃ system. The film and substrate cell seems equal, pointing towards perfect homotaxy. (b) LaAlO₃ (660) reflection in the same system. The film (tf) and substrate (s) reflections are clearly split, pointing towards a slight non-homoepitaxial relationship.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 20| Part 4| May 2013| Pages 644-647

doi:10.1107/S0909049513009102

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