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Figure 2
(a) Bright-field image of a T. spiralis UCH37 1-226/UbVME complex crystal (∼100 µm thick) and the corresponding (b) epi-SHG, (c) trans-SHG, (d) TPE-UVF and (e) X-ray raster scan within the 300 × 300 µm box. (f) X-ray diffraction of a representative 10 µm-diameter area from (e). X-ray energy: 12 keV; exposure time: 1 s; photon flux: 2.7 × 109 photons s−1 (10-fold attenuation); detector distance: 300 mm; maximum theoretical resolution: 2.25 Å. The large difference in the epi- and trans-SHG signals is expected for thick samples owing to the difference in the forward and backward coherence length. The intensities of the two directions will approach equality as the sample thickness approaches the backwards coherence length (∼100 nm). Scale bars are 100 µm. (Three darkened spots, apparent in this figure, arose from separate X-ray `burn tests' to assess X-ray damage, the results of which will be published in a future study.)

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