disable zoom     view article     reuse permissions
Figure 4
Raw image data of the SIXM-CT system obtained when the line-focused beam is located at the line AB shown in Fig. 5(a)[link]. Vertical line profiles of differential phase shift ∂f/∂x derived from the raw data by using equation (5)[link] are also indicated on the right-hand side. Exposure time is 60 ms.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 20| Part 5| July 2013| Pages 793-800
https://doi.org/10.1107/S0909049513018876
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS
We use cookies on our websites, and by using this site you are consenting to them: allow all or manage