Grazing-incidence small-angle X-ray scattering from Ge nanodots self-organized on Si(001) examined with soft X-rays

Yamamoto, T.; Okuda, H.; Takeshita, K.; Usami, N.; Kitajima, Y.; Ogawa, H.

doi:10.1107/S1600577513026088

Journal of Synchrotron Radiation Journal of
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Figure 4
GISAXS intensity calculated for the model nanodot structure, with spatially Si-capped Ge nanodots self-organized on Si(001) using DWBA. (a) φ = 0° for SX, (b) φ = 22.5° for SX, (c) φ = 0° for HX, (d) φ = 22.5° for HX.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| November 2014| Pages 161-164

doi:10.1107/S1600577513026088

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