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Figure 4
Atomic force microscopy (AFM) images on the mirror surfaces, (a) left edge of S1, (b) central region of S2, within a field of view of 172.9 µm × 128.6 µm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 1| November 2014| Pages 16-23
doi:10.1107/S1600577513024077
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