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Figure 6
(a) Horizontal (orange) and (b) vertical (magenta) beam profiles of the doubly reflected beam when the Montel mirror is fully illuminated through an entrance slit of 2 mm × 2 mm obtained from both experimental data (exp) and X-ray tracing simulation (sim). The focus spots in each case are shown in the insets; the beam profiles were extracted as indicated by the arrows. The simulated intensities have been normalized to that of the measured data.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 1| November 2014| Pages 16-23
doi:10.1107/S1600577513024077
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