X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals

Terekhov, V.A.; Tetelbaum, D.I.; Spirin, D.E.; Pankov, K.N.; Mikhailov, A.N.; Belov, A.I.; Ershov, A.V.; Turishchev, S.Yu.

doi:10.1107/S1600577513030026

Journal of Synchrotron Radiation Journal of
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Figure 6
Si L_2,3 XANES spectra for the N1 sample (implantation dose 6 × 10¹⁶ cm⁻²) formed on the (100) substrate registered at different grazing angles, and the difference spectrum for 60° and 90° registration.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| December 2014| Pages 209-214

doi:10.1107/S1600577513030026

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