Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering

Li, H.; Zhu, J.; Wang, Z.; Chen, H.; Wang, Y.; Wang, J.

doi:10.1107/S1600577513024296

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 2
Absolute value of the coefficients in the integrated intensity versus thickness ratio. The dashed line is for the autocorrelation terms. Solid lines are for the cross-correlation terms with different integration intervals ( $[[m-1]\pi/\Lambda]$ , $[[m+1]\pi/\Lambda]$ ).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| November 2014| Pages 97-103

doi:10.1107/S1600577513024296

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