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Figure 4
Measured (black solid lines) and fitted (red dashed lines) low-angle X-ray reflection curves of the four W/Si samples.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 1| November 2014| Pages 97-103
doi:10.1107/S1600577513024296
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