High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

Rosenthal, M.; Doblas, D.; Hernandez, J.J.; Odarchenko, Y.I.; Burghammer, M.; Di Cola, E.; Spitzer, D.; Antipov, A.E.; Aldoshin, L.S.; Ivanov, D.A.

doi:10.1107/S1600577513024892

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
(a) Room-temperature experiment showing the heating effect of a nano-focused X-ray beam modulated by a sequence of fast-shutter openings (top). Variation of the In particle temperature (middle) and temperature modulation amplitude (bottom). (b) Zoomed segments of the temperature profile due to individual X-ray pulses of 2 and 20 s (left and right, respectively).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| November 2014| Pages 223-228

doi:10.1107/S1600577513024892

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