High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

Rosenthal, M.; Doblas, D.; Hernandez, J.J.; Odarchenko, Y.I.; Burghammer, M.; Di Cola, E.; Spitzer, D.; Antipov, A.E.; Aldoshin, L.S.; Ivanov, D.A.

doi:10.1107/S1600577513024892

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Figure 4
(a) Image of the same In particle as in Fig. 2

(c) obtained by mapping the intensity of a selected 110 reflection of In (encircled on the two-dimensional WAXS pattern in the inset). The pixel size is 2 µm × 2 µm. (b) Image of the particle obtained using absorption of the incident X-ray beam. (c) Topographical map of the particle recalculated from the absorption image given in (b). (d) Rise of the particle temperature due to the incident X-ray beam plotted as a function of the spatial position. (e) The horizontal cross section of the temperature map in (d) is given as vertical sticks and that of the X-ray absorption in (b) shown as filled circles. Both cross sections correspond to the line y = 25 µm. (f) Increase of the In particle temperature as a function of the X-ray beam absorption for the whole scanned area. The solid line is the linear fit to the data.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 1| November 2014| Pages 223-228

doi:10.1107/S1600577513024892

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