view article
Figure 6
Wide-area X-ray mapping for a fixed test sample using a fibre scan. (a) Test sample composed of cobalt, nickel and copper films, of thickness 15 µm, 10 µm and 10 µm, respectively. (b) Absorbance map at a photon energy of 12.4 keV. The scan step and integration time were set to be 500 µm and 1 s, respectively, in order to save the measurement time, although the potential spatial resolution is 50 µm as obtained from Fig. 5(a)[link]. (c) Graphs showing X-ray absorption spectra at the positions indicated on the absorbance map.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 1| December 2014| Pages 61-65
doi:10.1107/S1600577513029706
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS