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Figure 6
(a) Beam intensity measurement with the ion chamber at the sample position during an EXAFS scan. The open circles denote a measurement taken with intensity and position feedback activated whereas the triangles indicate the same measurement without feedback. For the measurement without feedback the monochromator was manually aligned at a single energy (5.2 keV). Just above 5.2 keV beam intensity is lost due to the excitation of another reflection of the silicon crystals. The solid line indicates the theoretical behaviour of the beamline. (b) Rocking curves of the DCM for five energies highlighting the issue of fast degradation of produced beam intensity as a function of low energy.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| January 2014| Pages 401-408
doi:10.1107/S1600577513034747
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