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Figure 3
Gaussian width of XBI profiles acquired in different positions along the focused beam that corresponds to the beam size in the horizontal (top row) and vertical (bottom row) directions. The two sets of data are shown for two combinations of device magnification and aperture size as indicated by the captions of the corresponding columns. Other XBI parameters are given in the text.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| February 2014| Pages 333-339
doi:10.1107/S1600577513034759
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