view article

Figure 3
Gaussian width of XBI profiles acquired in different positions along the focused beam that corresponds to the beam size in the horizontal (top row) and vertical (bottom row) directions. The two sets of data are shown for two combinations of device magnification and aperture size as indicated by the captions of the corresponding columns. Other XBI parameters are given in the text.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds