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Figure 6
Top left: vertical beam projections obtained by integrating the intensity at the beam spot in the horizontal direction. Top right: horizontal beam projections. Bottom, from left to right: full beam, and beams through the 30 and 10 µm apertures, imaged by the on-axis sample microscope on a YAG:Ce scintillator screen on the third diagnostic device of the beam-shaping unit.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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