Highly efficient beamline and spectrometer for inelastic soft X-ray scattering at high resolution

Lai, C.H.; Fung, H.S.; Wu, W.B.; Huang, H.Y.; Fu, H.W.; Lin, S.W.; Huang, S.W.; Chiu, C.C.; Wang, D.J.; Huang, L.J.; Tseng, T.C.; Chung, S.C.; Chen, C.T.; Huang, D.J.

doi:10.1107/S1600577513030877

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Figure 10
RIXS spectra of NiO excited with photon energy varied about the Ni L₃ edge: (a) colour mapping of RIXS intensity across the L₃ absorption edge, obtained by combining RIXS spectra excited every 500 meV, (b) RIXS spectra excited with incident photons of energies 853, 855 and 857 eV, (c) RIXS spectra in an energy range near the elastic scattering excited with of selected incident energies labeled in units of eV, and (d) illustration of the scattering geometry. All RIXS spectra were taken at temperature T = 300 K. The energy loss is defined as E_loss = E_out - E_in, in which E_in and E_out are, respectively, the energies of incident and scattered X-rays due to inelastic scattering. The energy spacing between successive data points is limited by the CCD pixel size. The inset of (b) plots the X-ray absorption spectrum about the Ni L₃-edge.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 21| Part 2| January 2014| Pages 325-332

doi:10.1107/S1600577513030877

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